Scanning Electron Microscopes: Difference between revisions
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A scanning electron microscope (SEM) is a microscope which uses a focused beam of electrons, which bounce off the surface of the specimen, to create an image. This creates a 3D image of the surface of the specimen. | A scanning electron microscope (SEM) is a microscope which uses a focused beam of [[electron|electrons]], which bounce off the surface of the specimen, to create an image. This creates a 3D image of the surface of the specimen. | ||
Since a beam of electrons is used to create the image, the sample is placed in a vacuum and so the sample must be non-living <ref>Stokes, Debbie J. (2008). Principles and Practice of Variable Pressure Environmental Scanning Electron Microscopy. ISBN 978-0470758748</ref>. | |||
=== References === | |||
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Latest revision as of 20:04, 23 October 2017
A scanning electron microscope (SEM) is a microscope which uses a focused beam of electrons, which bounce off the surface of the specimen, to create an image. This creates a 3D image of the surface of the specimen.
Since a beam of electrons is used to create the image, the sample is placed in a vacuum and so the sample must be non-living [1].
References
- ↑ Stokes, Debbie J. (2008). Principles and Practice of Variable Pressure Environmental Scanning Electron Microscopy. ISBN 978-0470758748