Scanning Electron Microscopes
A scanning electron microscope (SEM) is a microscope which uses a focused beam of electrons, which bounce off the surface of the specimen, to create an image. This creates a 3D image of the surface of the specimen.
Since a beam of electrons is used to create the image, the sample is placed in a vacuum and so the sample must be non-living. [1]
- ↑ Stokes, Debbie J. (2008). Principles and Practice of Variable Pressure Environmental Scanning Electron Microscopy. ISBN 978-0470758748